share_log

Aehr Test Systems to Participate in the Jefferies Semiconductor, IT Hardware & Communications Technology Conference on August 27, 2024

Aehr Test Systems to Participate in the Jefferies Semiconductor, IT Hardware & Communications Technology Conference on August 27, 2024

aehr test systems將參加2024年8月27日舉行的Jefferies半導體、硬件和通信科技會議
Aehr Test Systems ·  08/21 12:00

Fremont, CA (August 21, 2024) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will participate in the Jefferies Semiconductor, IT Hardware & Communications Technology Conference taking place August 27-28, 2024 at the Four Seasons Hotel in Chicago. President and CEO Gayn Erickson and CFO Chris Siu will be hosting meetings with investors throughout the day on Tuesday, August 27.

加利福尼亞州弗裏蒙特(2024年8月21日)- 半導體測試和老化設備全球供應商aehr test systems(納斯達克股票代碼:AEHR)今日宣佈,將參加於2024年8月27-28日在芝加哥四季酒店舉辦的傑弗里斯半導體、硬件及通信技術大會。總裁兼首席執行官蓋恩·埃裏克森(Gayn Erickson)和首席財務官克里斯·邵(Chris Siu)將於8月27日星期二全天與投資者舉行會議。

"We look forward to discussing with investors and shareholders our unique wafer level test and package part burn-in solutions for semiconductor production and the markets they serve, including our recently closed acquisition of Incal Technology and new high power packaged part reliability/burn-in test solutions that expand our addressable market within the rapidly growing artificial intelligence (AI) semiconductor market," said Mr. Erickson. "Aehr Test provides complete turn-key solutions for improving quality, reliability, and yield of semiconductors such as silicon carbide devices used in electric vehicles and charging infrastructure, gallium nitride devices for multiple power conversion applications, and silicon photonics devices used in data centers and 5G infrastructure and optical input/output (I/O) and co-packaged optics devices as well as AI processors in both wafer level and packaged part device forms. The adoption of wafer level test and packaged parts burn-in of these devices is a significant growth driver for Aehr Test."

「我們期待與投資者和股東討論我們的獨特晶圓級測試和芯片燒錄解決方案,這些解決方案用於半導體生產和它們服務的市場,包括我們最近收購的Incal Technology以及新的高功率芯片可靠性/燒錄測試解決方案,在快速增長的人工智能(AI)半導體市場內擴大了我們的可尋地址市場,」Erickson先生說:「Aehr Test爲提高半導體的質量、可靠性和產量提供了完整的一站式解決方案,例如用於電動汽車及充電基礎設施的碳化硅器件,用於多個功率轉換應用的氮化鎵器件,例如用於數據中心和5G基礎設施的硅光子器件和光學輸入/輸出(I/O)和共封裝光學器件,以及晶圓級和芯片級形式的AI處理器。這些器件採用晶圓級測試和芯片級燒錄是Aehr Test的重要增長驅動力。」

For additional information or to schedule a meeting with Aehr management, please contact your Jefferies representative or Aehr's investor relations firm, MKR Investor Relations, at aehr@mkr-group.com.

如需更多信息或安排與Aehr管理層的會議,請聯繫您的Jefferies代表或Aehr的投資者關係公司MKR Investor Relations,郵箱:aehr@mkr-group.com。

About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and package part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products and solutions. Aehr has developed and introduced several innovative products including the FOX-P families of test and burn-in systems and FOX WaferPak Aligner, FOX WaferPak Contactor, FOX DiePak Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. Acquired through its acquisition of Incal Technology, Inc., Aehr's new line of high-power packaged part reliability/burn-in test solutions for Artificial Intelligence (AI) semiconductor manufacturers, including its ultra-high-power Sonoma family of test solutions for AI accelerators, GPUs, and high-performance computing (HPC) processors, position Aehr within the rapidly growing AI market as a turn-key provider of reliability and testing that span from engineering to high volume production. For more information, please visit Aehr Test Systems' website at .

aehr@mkr-group.com
Aehr Test Systems總部位於加利福尼亞弗裏蒙特市,是半導體器件在晶圓級別、分離晶片和封裝零件等測試、老化和穩定的測試解決方案的主要供應商,在全球已安裝了數千套Aehr Test測試設備。包括新能源汽車、電動汽車充電基礎設施、太陽能和風能、計算機、數據和通信基礎設施以及固態存儲在內的多個應用對半導體的質量、可靠性、安全和安防需求日益增長,推動了Aehr Test產品和解決方案的新增測試需求、增量產能需求和新機遇。Aehr Test已經開發並推出了多款創新產品,包括FOX-P系列測試和老化系統、FOX WaferPak Aligner、FOX WaferPak Contactor、FOX DiePak Carrier和FOX DiePak Loader。FOX-XP和FOX-NP系統是全晶圓接觸和分離晶片/模塊測試和老化系統,可以測試、老化和穩定各種器件,如尖端的碳化硅和其他功率半導體、移動電話、平板電腦和其他計算設備中使用的2D和3D傳感器、存儲器半導體、處理器、微控制器、芯片組以及光子學和集成光學器件。FOX-CP系統是低成本的單晶圓緊湊型邏輯、存儲器和光子器件測試解決方案,並是FOX-P產品系列的新成員。FOX WaferPak Contactor包含獨特的全晶圓接觸器,可測試高達300mm的晶圓,使芯片製造商能夠在FOX-P系統上對整個晶圓進行測試、老化和穩定。FOX DiePak Carrier允許在FOX-NP和FOX-XP系統上對單個裸片和模塊進行測試、老化和穩定,每個DiePak最多可並行測試1024個器件,最多可同時測試九個DiePak。通過收購Incal Technology, Inc.,Aehr引入了新的高功率封裝器件可靠性/老化測試解決方案,面向人工智能(AI)半導體制造商,包括其針對AI加速器、GPU和高性能計算(HPC)處理器的超高功率Sonoma系列測試解決方案,將Aehr定位於迅速增長的AI市場,成爲從工程到高產量的可靠性和測試解決方案的一站式供應商。欲了解更多信息,請訪問Aehr Test Systems網站。

Contacts:
Aehr Test Systems
Chris Siu
Chief Financial Officer
csiu@aehr.com
(510) 623-9400 x309
MKR Investor Relations Inc.
Todd Kehrli or Jim Byers
Analyst/Investor Contact
(323) 468-2300
aehr@mkr-group.com
聯繫人:
www.aehr.com
Chris Siu
致富金融(臨時代碼)
csiu@aehr.com
(510) 623-9400 x309
MKR Investor Relations公司
Todd Kehrli或Jim Byers
分析師/投資者聯繫方式
(323)468-2300
aehr@mkr-group.com

譯文內容由第三人軟體翻譯。


以上內容僅用作資訊或教育之目的,不構成與富途相關的任何投資建議。富途竭力但無法保證上述全部內容的真實性、準確性和原創性。
    搶先評論