share_log

Aehr Test Systems to Participate in the 21st Annual Craig-Hallum Institutional Investor Conference on May 29

Aehr Test Systems to Participate in the 21st Annual Craig-Hallum Institutional Investor Conference on May 29

Aehr Test Systems將於5月29日參加第21屆Craig-Hallum年度機構投資者會議
Aehr Test Systems ·  05/21 12:00

Fremont, CA (May 21, 2024) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that President and CEO Gayn Erickson will be participating in one-on-one meetings with investors at the 21st Annual Craig-Hallum Institutional Investor Conference taking place Wednesday, May 29, 2024 at the Depot Renaissance Hotel in Minneapolis.

加利福尼亞州弗裏蒙特(2024 年 5 月 21 日) — 半導體測試和老化設備的全球供應商Aehr Test Systems(納斯達克股票代碼:AEHR)今天宣佈,總裁兼首席執行官蓋恩·埃裏克森將在21世紀與投資者進行一對一的會晤st 年度Craig-Hallum機構投資者會議將於2024年5月29日星期三在明尼阿波利斯的倉庫萬麗酒店舉行。

"I look forward to discussing our unique wafer level test and burn-in solutions for semiconductor production and the markets they serve with investors and shareholders at the Craig-Hallum conference," said Mr. Erickson. "Aehr Test provides complete production solutions for improving quality, reliability, and yield of semiconductors such as silicon carbide devices used in electric vehicles and charging infrastructure, gallium nitride devices for multiple power conversion applications, and silicon photonics devices used in data centers and 5G infrastructure, as well as for new applications such as optical input/output (I/O) and co-packaged optics devices that are on the horizon. The adoption of wafer level test and burn-in of devices is a significant growth driver for Aehr Test."

埃裏克森說:“我期待在Craig-Hallum會議上與投資者和股東討論我們獨特的半導體生產及其所服務的市場的晶圓級測試和老化解決方案。”“Aehr Test爲提高半導體的質量、可靠性和產量提供完整的生產解決方案,例如用於電動汽車和充電基礎設施的碳化硅器件、用於多種功率轉換應用的氮化鎵器件、用於數據中心和5G基礎設施的硅光子學器件,以及即將推出的光學輸入/輸出(I/O)和共封裝光學設備等新應用。採用晶圓級測試和設備老化是Aehr Test的重要增長動力。”

For additional information, or to schedule a meeting with Aehr management, please contact your Craig-Hallum representative, or Aehr's investor relations firm, MKR Investor Relations, at aehr@mkr-group.com.

欲了解更多信息或安排與 Aehr 管理層的會面,請聯繫您的 Craig-Hallum 代表或 Aehr 的投資者關係公司 MKR 投資者關係公司,地址爲 aehr@mkr-group.com

About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and package part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products and solutions. Aehr has developed and introduced several innovative products including the FOX-P families of test and burn-in systems and FOX WaferPak Aligner, FOX WaferPak Contactor, FOX DiePak Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. For more information, please visit Aehr Test Systems' website at www.aehr.com.

關於 Aehr 測試系統
Aehr Test Systems總部位於加利福尼亞州弗裏蒙特,是測試、老化和穩定晶圓級、單晶芯片和封裝零件形式的半導體器件的測試解決方案的領先供應商,已在全球安裝了數千個系統。用於多種應用(包括電動汽車、電動汽車充電基礎設施、太陽能和風能、計算、數據和電信基礎設施以及固態存儲器和存儲)的半導體的質量、可靠性、安全和安保需求不斷提高,這推動了額外的測試需求、容量需求的增加,以及Aehr Test產品和解決方案的新機遇。Aehr 開發並推出了幾款創新產品,包括 FOX-P 系列測試和老化系統以及 FOX WaferPak Aligner、FOX WaferPak 接觸器、FOX DiePak Carrier 和 FOX DiePak Loader。FOX-XP和FOX-NP系統是全晶圓接觸和單晶片/模塊測試和老化系統,可以測試、老化和穩定各種設備,例如尖端的碳化硅基和其他功率半導體、用於手機、平板電腦和其他計算設備的二維和三維傳感器、存儲器半導體、處理器、微控制器、片上系統以及光子學和集成光學設備。FOX-CP系統是用於邏輯、存儲器和光子器件的低成本單晶圓緊湊型測試解決方案,也是FOX-P產品系列的最新成員。FOX WaferPak 接觸器包含一個獨特的全晶圓接觸器,能夠測試最大300mm的晶圓,使集成電路製造商能夠在FOX-P系統上對整個晶圓進行測試、燒入和穩定。FOX DiePak Carrier 允許在 FOX-NP 和 FOX-XP 系統上同時測試、燒錄和穩定單個裸芯片和模塊,每個 DiePak 最多可並行 1024 臺設備,一次最多可測試 9 個 DiePaks。欲了解更多信息,請訪問 Aehr 測試系統的網站 www.aehr.com

Contacts:
Aehr Test Systems
Chris Siu
Chief Financial Officer
csiu@aehr.com
MKR Investor Relations Inc.
Todd Kehrli or Jim Byers
Analyst/Investor Contact
(323) 468-2300
aehr@mkr-group.com
聯繫人:
Aehr 測試系統
蕭國雄
首席財務官
csiu@aehr.com
MKR 投資者關係公司
Todd Kehrli 或 Jim Byers
分析師/投資者聯繫人
(323) 468-2300
aehr@mkr-group.com

譯文內容由第三人軟體翻譯。


以上內容僅用作資訊或教育之目的,不構成與富途相關的任何投資建議。富途竭力但無法保證上述全部內容的真實性、準確性和原創性。
    搶先評論