This announcement is a separate document:
ブイ・テクノロジー：シリコンウェーハの製造歩留まりを飛躍的に改善する、業界最高速の結晶欠陥検査装置の出荷を開始
V Technology: Shipment of the fastest crystal defect inspection device in the industry, which dramatically improves the manufacturing yield of silicon wafers, begins
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